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| 饰品银含量和覆盖层厚度的X射线荧光检测 |
| Testing of Silver Content and Coating Thickness of Jeweler by X-ray Fluorescence Spectrometer |
| 投稿时间：2018-05-04 |
| DOI： |
| 中文关键词: 分析化学 X射线荧光法 银饰品 覆盖层厚度 样品总厚度 |
| 英文关键词: analysis chemistry X-ray fluorescence silver jeweler coating thickness jeweler thickness |
| 基金项目: |
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| 摘要点击次数: 1984 |
| 全文下载次数: 1852 |
| 中文摘要: |
| 采用X射线荧光显微仪和X射线荧光镀层测厚仪，以及K值计算法，对银饰品中银含量、镍覆盖层厚度和样品总厚度进行检测研究。银含量检测的结果与国家标准溴化钾容量法(电位滴定法)(GB/T 17832-2008)的检测结果吻合。 |
| 英文摘要: |
| X-ray fluorescence microscope analyzer and X-ray coating thickness meter were used to study on testing of silver content, nickel coating thickness and jeweler thickness of silver jeweler. Among those, K value calculated method was applied to obtain the results of silver contents, which were almost equal to the results by national standard volumetric(potentionmetric) method using potassium bromide (GB/T 17832-2008). |
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